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Applications of Scanning Electron Microscopy in Polymer Characterization
- ACTA POLYMERICA SINICA Vol. 53, Issue 5, Pages: 539-560(2022)
- 作者机构：
杭州师范大学材料与化学化工学院 杭州 311121
- 作者简介：
- 基金信息：
DOI：10.11777/j.issn1000-3304.2021.21377
CLC：Published：20 May 2022，
Published Online：08 March 2022，
Received：11 December 2021，
Accepted：07 January 2022
- 稿件说明：
移动端阅览
郑鑫,由吉春,朱雨田等.扫描电镜技术在高分子表征研究中的应用[J].高分子学报,2022,53(05):539-560.
Zheng Xin,You Ji-chun,Zhu Yu-tian,et al.Applications of Scanning Electron Microscopy in Polymer Characterization[J].ACTA POLYMERICA SINICA,2022,53(05):539-560.
郑鑫,由吉春,朱雨田等.扫描电镜技术在高分子表征研究中的应用[J].高分子学报,2022,53(05):539-560. DOI： 10.11777/j.issn1000-3304.2021.21377.
Zheng Xin,You Ji-chun,Zhu Yu-tian,et al.Applications of Scanning Electron Microscopy in Polymer Characterization[J].ACTA POLYMERICA SINICA,2022,53(05):539-560. DOI： 10.11777/j.issn1000-3304.2021.21377.
摘要
扫描电子显微镜(scanning electron microscope，SEM)是表征高分子材料微观结构及其组成信息重要的手段之一，具有操作简便、信号电子种类多样且对样品损伤较小等特点.本文系统阐述了SEM的工作原理，通过与透射电子显微镜(transmission electron microscope，TEM)进行比较，突出了其优势与特色. 详细讨论了该技术的测试方法，包括样品制备、仪器参数设定、操作技巧与图像处理，并揭示了获得高质量SEM图像的关键技术. 介绍了SEM不同的信号电子成像、SEM与其他仪器联用及SEM原位分析技术在高分子材料表征中的应用与进展. 最后，对SEM的发展趋势进行了展望.
Abstract
Scanning electron microscopy (SEM) is one of the most important tools for the characterization of polymer materials' microstructure and composition. First
it is easy to operate; then there are various electronic signals available which contain different sample information for SEM imaging; besides
there are little sample damage during SEM observation. In this work
the working principle of SEM was elucidated systematically. Also
a comparison was made between SEM and TEM with respect to working principle
resolution and magnification
view and depth of field
sample preparation
sample damage and pollution. Therefore
the advantages and features of SEM were highlighted. In addition
the experiment methods of SEM were illustrated in detail
including sample preparation
instrument parameter settings
operation skills and image treatment. The key factors which determines the quality of SEM image were revealed. The main applications of SEM in polymer characterization were introduced. Specifically
the secondary electrons imaging was used to investigate the microstructure of polymer composition
compatibility of polymer blends
crystal structure of polymer
morphology of polymer porous membrane
biocompatibility of polymer material
self-assemble behavior of polymer and so on. Besides
the backscattered electrons
characteristic X-ray
transmittance electrons were also used to reveal the morphology and composition information of polymer systems. The combination of SEM with Raman spectrometer and Focused ion beam and the
in situ
SEM techniques were illustrated. Finally
the recent trends of SEM development were prospected.
关键词
扫描电子显微镜高分子材料微观结构组成信息应用
Keywords
Scanning electron microscopyPolymer materialMicrostructureCompositionApplication
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