Du Zuo-dong, Chen Jian-hua, FENG Sheng-yu, WANG Dian-xun. THE STUDY OF POLY (TETRAPHENYLPHENYL) METHYLSI- LANE, POLYVINYLMETHYLSILANE AND THEIR COPO- LYMER BY MEANS OF X-RAY PHOTOELECTRON SPECTROSCOPY (XPS)[J]. Acta Polymerica Sinica, 1989,(1):42-45.
Du Zuo-dong, Chen Jian-hua, FENG Sheng-yu, WANG Dian-xun. THE STUDY OF POLY (TETRAPHENYLPHENYL) METHYLSI- LANE, POLYVINYLMETHYLSILANE AND THEIR COPO- LYMER BY MEANS OF X-RAY PHOTOELECTRON SPECTROSCOPY (XPS)[J]. Acta Polymerica Sinica, 1989,(1):42-45.DOI:
polyvinylmethylsilane and their copolymer were investigated by means of X-ray photoelectron spectroscopy (XPS). Existences of (P-P)x
(P-d)x and (d-d)x in polysilanes could be characterized by XPS shake-up satellite peaks of C1s and Si2p. The order of ionization. potentials of various polysilanes have been also given by their XPS valence band spectra in this paper.