小角X射线散射技术在高分子表征中的应用

吕冬; 卢影; 门永锋

doi:10.11777/j.issn1000-3304.2020.20249

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小角X射线散射技术在高分子表征中的应用

综述 | 更新时间：2024-02-20

- 小角X射线散射技术在高分子表征中的应用
- Typical Applications of Small-angle X-ray Scattering Technique in Polymer Characterization
- 高分子学报 2021年52卷第7期页码：822-839
- 作者机构：
  
  中国科学院长春应用化学研究所高分子物理与化学国家重点实验室长春 130022
- 作者简介：
  
  [ "门永锋，男，1973年生. 1995年获东南大学理学学士，1998年获中国科学院长春应用化学研究所理学硕士，2001年德国弗赖堡大学物理系获自然科学博士. 2002~2005年，德国BASF公司高分子研究中心，博士后、Physicist. 2005年加入中国科学院长春应用化学研究所开展工作. 2005年入选中国科学院百人计划，2014年入选科技部中青年科技创新领军人才，2016年入选第二批万人计划科技创新领军人才，2015年获国家基金委杰出青年基金、英国皇家学会牛顿高级学者基金. 目前担任高分子物理与化学国家重点实验室主任、中国晶体学会小角散射专业委员会主任、IUPAC商用聚合物结构与性能分会主席. 主要从事高分子结构与性能方面研究工作." ]
- 基金信息：
  
  国家自然科学基金(基金号 51525305)
- DOI：10.11777/j.issn1000-3304.2020.20249
  中图分类号：
- 纸质出版日期：2021-07-20，
  
  网络出版日期：2021-05-21，
  
  收稿日期：2020-11-16，
  
  修回日期：2020-12-21，
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吕冬,卢影,门永锋.小角X射线散射技术在高分子表征中的应用[J].高分子学报,2021,52(07):822-839.

Lyu Dong,Lu Ying,Men Yong-feng.Typical Applications of Small-angle X-ray Scattering Technique in Polymer Characterization[J].ACTA POLYMERICA SINICA,2021,52(07):822-839.
吕冬,卢影,门永锋.小角X射线散射技术在高分子表征中的应用[J].高分子学报,2021,52(07):822-839. DOI： 10.11777/j.issn1000-3304.2020.20249.

Lyu Dong,Lu Ying,Men Yong-feng.Typical Applications of Small-angle X-ray Scattering Technique in Polymer Characterization[J].ACTA POLYMERICA SINICA,2021,52(07):822-839. DOI： 10.11777/j.issn1000-3304.2020.20249.

摘要

小角X射线散射(SAXS)技术是表征高分子材料微观结构的一种重要手段. 当X射线穿过材料时，在材料不均一的电子云密度分布作用下，发生散射并形成特定的散射图案，使得我们可以根据特定的模型来反推材料的微观结构，并计算相关结构参数. SAXS特有的对微观结构的统计平均及无损探测使其成为了一种不可或缺的高分子材料微观结构分析手段. 本文首先简述了SAXS技术的基本理论，在此基础上根据测试中的实际问题给出了测试时可采取的实验技巧. 最后，结合典型实例，概述了高分子材料中可用SAXS技术表征的微观结构及其相应的理论模型. 希望本文能作为入门文献，帮助初学者更好地理解SAXS技术的原理，并结合实际需求迅速了解SAXS技术的适用范围及相关实验技巧，高效地完成相关实验.

Abstract

Small-angle X-ray scattering (SAXS) technique is one of the most significant methods for determining the micro-structures of polymeric materials due to its statistical average and nondestructive detecting feature. Usually

a monochromatic parallel beam of X-rays is used for scattering experiments. When passing through a sample

the oscillating electromagnetic field (mostly the electric part) of X-rays interact with electrons

making the electrons secondary sources of X-rays of the same frequency. Those secondary X-rays interfere with each other to form a specific pattern deviating from the primary beam path depending on the actual locations of the electrons in the sample. Mathematically

such interferences can be obtained by a summation of all secondary X-ray waves. As the number of the electrons within the sample is very large

an integration is used to represent the summation mentioned above. Because of the wave nature of the X-rays

the amplitude of the scattered X-rays determined by the above integration is just a Fourier transformation of the electron density distribution within the scattering volume. Due to the limitation in detection technique

the complex value of amplitude of scattered X-rays with real and imaginary parts cannot be recorded. It is the intensity rather than the amplitude that is recorded during experiments resulting in a loss of the phase information. Therefore

obtaining exact structural information (electron density distribution) becomes not easy and must be based on specific model fittings. Besides structures

SAXS intensity distribution can be used to investigate sample’s gross properties such as fraction of phases or local properties such as fractal dimensions of interfaces between phases. This work began with an introduction of the fundamental theories of the SAXS technique

followed by practical suggestions on performing the experiments and brief summaries of models developed for different structures. The authors wish this review could help the beginners to comprehend the elements of the SAXS technique and serve as an instruction manual for valid data acquisition.

关键词

高分子表征小角X射线散射(SAXS)片晶微观结构

Keywords

Polymer characterizationSmall-angle X-ray scattering (SAXS)LamellaeMicro-structure

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