扫描电镜技术在高分子表征研究中的应用

郑鑫; 由吉春; 朱雨田; 李勇进

doi:10.11777/j.issn1000-3304.2021.21377

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扫描电镜技术在高分子表征研究中的应用

综述 (高分子表征技术专题) | 更新时间：2024-10-08

- 扫描电镜技术在高分子表征研究中的应用
- Applications of Scanning Electron Microscopy in Polymer Characterization
- 高分子学报 2022年53卷第5期页码：539-560
- 作者机构：
  
  杭州师范大学材料与化学化工学院杭州 311121
- 作者简介：
  
  [ "李勇进，男，1973年生. 1996年和1999年在同济大学分别获学士和硕士学位，2002年获上海交通大学博士学位. 2002~2011年，历任日本产业技术综合研究所JSPS博士后和研究员. 2011年加入杭州师范大学，主要从事高分子材料成型加工研究. 先后获得高分子成型加工新锐创新奖(2017年)、冯新德高分子奖提名奖(2018年和2020年)、国际高分子加工学会(PPS)的Morand Lambla奖(2019年)、浙江省自然科学奖(2020年)等." ]
- 基金信息：
  
  国家自然科学基金(基金号 ┣52103026);51890872┫;浙江省自然科学基金重大项目(基金号 LD19E030001)
- DOI：10.11777/j.issn1000-3304.2021.21377
  中图分类号：
- 纸质出版日期：2022-05-20，
  
  网络出版日期：2022-03-08，
  
  收稿日期：2021-12-11，
  
  录用日期：2022-01-07
- 稿件说明：
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郑鑫,由吉春,朱雨田等.扫描电镜技术在高分子表征研究中的应用[J].高分子学报,2022,53(05):539-560.

Zheng Xin,You Ji-chun,Zhu Yu-tian,et al.Applications of Scanning Electron Microscopy in Polymer Characterization[J].ACTA POLYMERICA SINICA,2022,53(05):539-560.
郑鑫,由吉春,朱雨田等.扫描电镜技术在高分子表征研究中的应用[J].高分子学报,2022,53(05):539-560. DOI： 10.11777/j.issn1000-3304.2021.21377.

Zheng Xin,You Ji-chun,Zhu Yu-tian,et al.Applications of Scanning Electron Microscopy in Polymer Characterization[J].ACTA POLYMERICA SINICA,2022,53(05):539-560. DOI： 10.11777/j.issn1000-3304.2021.21377.

摘要

扫描电子显微镜(scanning electron microscope，SEM)是表征高分子材料微观结构及其组成信息重要的手段之一，具有操作简便、信号电子种类多样且对样品损伤较小等特点.本文系统阐述了SEM的工作原理，通过与透射电子显微镜(transmission electron microscope，TEM)进行比较，突出了其优势与特色. 详细讨论了该技术的测试方法，包括样品制备、仪器参数设定、操作技巧与图像处理，并揭示了获得高质量SEM图像的关键技术. 介绍了SEM不同的信号电子成像、SEM与其他仪器联用及SEM原位分析技术在高分子材料表征中的应用与进展. 最后，对SEM的发展趋势进行了展望.

Abstract

Scanning electron microscopy (SEM) is one of the most important tools for the characterization of polymer materials' microstructure and composition. First

it is easy to operate; then there are various electronic signals available which contain different sample information for SEM imaging; besides

there are little sample damage during SEM observation. In this work

the working principle of SEM was elucidated systematically. Also

a comparison was made between SEM and TEM with respect to working principle

resolution and magnification

view and depth of field

sample preparation

sample damage and pollution. Therefore

the advantages and features of SEM were highlighted. In addition

the experiment methods of SEM were illustrated in detail

including sample preparation

instrument parameter settings

operation skills and image treatment. The key factors which determines the quality of SEM image were revealed. The main applications of SEM in polymer characterization were introduced. Specifically

the secondary electrons imaging was used to investigate the microstructure of polymer composition

compatibility of polymer blends

crystal structure of polymer

morphology of polymer porous membrane

biocompatibility of polymer material

self-assemble behavior of polymer and so on. Besides

the backscattered electrons

characteristic X-ray

transmittance electrons were also used to reveal the morphology and composition information of polymer systems. The combination of SEM with Raman spectrometer and Focused ion beam and the

in situ

SEM techniques were illustrated. Finally

the recent trends of SEM development were prospected.

关键词

扫描电子显微镜高分子材料微观结构组成信息应用

Keywords

Scanning electron microscopyPolymer materialMicrostructureCompositionApplication

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