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Application of Atomic Force Microscopy in Polymer Characterization
- ACTA POLYMERICA SINICA Vol. 52, Issue 10, Pages: 1406-1420(2021)
- 作者机构：
郑州大学材料科学与工程学院 郑州 450001
- 作者简介：
- 基金信息：
DOI：10.11777/j.issn1000-3304.2020.20259
CLC：Published：20 October 2021，
Published Online：25 March 2021，
Received：28 November 2020，
Revised：16 December 2020，
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王冰花,陈金龙,张彬.原子力显微镜在高分子表征中的应用[J].高分子学报,2021,52(10):1406-1420.
Wang Bing-hua,Chen Jin-long,Zhang Bin.Application of Atomic Force Microscopy in Polymer Characterization[J].ACTA POLYMERICA SINICA,2021,52(10):1406-1420.
王冰花,陈金龙,张彬.原子力显微镜在高分子表征中的应用[J].高分子学报,2021,52(10):1406-1420. DOI： 10.11777/j.issn1000-3304.2020.20259.
Wang Bing-hua,Chen Jin-long,Zhang Bin.Application of Atomic Force Microscopy in Polymer Characterization[J].ACTA POLYMERICA SINICA,2021,52(10):1406-1420. DOI： 10.11777/j.issn1000-3304.2020.20259.
摘要
原子力显微镜(AFM)是一种在纳米尺度表征材料表面形貌结构、性能和演变的有效工具，在高分子科学领域具有广泛应用. AFM不仅可以表征高分子从单分子链到聚集态结构的形貌与性能，也能够原位研究外场作用下高分子结晶与熔融、嵌段高分子自组装和共混高分子相分离等过程，进一步采用基于扫描探针刻蚀技术的机械刻蚀、电致刻蚀和热致刻蚀等还可以构筑高分子功能化微图案. 这里首先简述AFM的工作原理及常用成像模式，进一步介绍AFM在高分子表征中的样品制备、扫描参数优化和图像数据处理的一些要点. 最后结合国内外相关研究进展，简单综述了AFM在高分子聚集态结构形貌与相转变表征、高分子纳米尺度性能表征和高分子纳米加工3个方面的典型应用.
Abstract
Atomic force microscopy (AFM) is a powerful tool for characterizing the nanoscale surface topography
structures
properties and dynamic process of materials
which has been widely used in polymer science. With the advances of multiparametric and multifunctional characterization
AFM not only can probe the surface topography and physicochemical properties of polymers from the structure of individual molecules to aggregation structures
but also enables the
in situ
study of crystallization and melting of polymers
self-assembly of block copolymers and phase separation of blend polymers by real-time imaging. Furthermore
the scanning probe lithography (SPL) (
e.g
. mechanical-SPL
bias induced SPL
thermal-SPL) provides an attractive nanofabrication method on polymer surface and demonstrates potential applications. Here
we present a survey on the working principle and classic imaging modes of AFM
with an emphasis on the preparation of polymer samples
the optimization of scan parameters
image processing and data analysis. And we summarize recent research progress on the applications of AFM in polymer science
mainly focusing on imaging the surface topography
quantitatively mapping the physicochemical properties
the dynamic evolution of phase transition
and nanofabrication method based on SPL. We hope this review would be conducive to understanding the AFM techniques and promote further applications of AFM in polymer characterization.
关键词
原子力显微镜高分子表征聚集态结构微观性能扫描探针刻蚀加工
Keywords
Atomic force microscopyPolymer characterizationAggregation structureNanoscale properties of polymerScanning probe lithography
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